DocumentCode
2287064
Title
Estimation for ADC´s INL Using a Moving-Average Filter
Author
Wu, Minshun ; Chen, Guican
Author_Institution
Sch. of Electron. & Inf. Eng., Xi´´an Jiaotong Univ., Xi´´an
fYear
2008
fDate
20-22 Dec. 2008
Firstpage
544
Lastpage
547
Abstract
The sine wave code density test is the most prevalent technique to estimate integral nonlinearity (INL) of ADCs. The main disadvantage of this method is that the number of samples tends to increase exponentially with the resolution of ADCs. The moving-average filtered sine wave code density test under coherent sampling condition is proposed in this paper. The proposed method needs fewer samples within the almost same accuracy of INL, and it is especially suitable to the estimation for high-resolution ADCs´ INL. The proposed method is analyzed theoretically and validated by means of simulation and experimental results.
Keywords
analogue-digital conversion; circuit testing; moving average processes; ADC; coherent sampling condition; integral nonlinearity; moving-average filter; sine wave code density test; Analytical models; Chebyshev approximation; Discrete Fourier transforms; Electronic equipment testing; Electronic mail; Frequency; Information filtering; Information filters; Sampling methods; System testing; ADC Test; INL; Moving-average Filter;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Electrical Engineering, 2008. ICCEE 2008. International Conference on
Conference_Location
Phuket
Print_ISBN
978-0-7695-3504-3
Type
conf
DOI
10.1109/ICCEE.2008.137
Filename
4741044
Link To Document