• DocumentCode
    2287064
  • Title

    Estimation for ADC´s INL Using a Moving-Average Filter

  • Author

    Wu, Minshun ; Chen, Guican

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Xi´´an Jiaotong Univ., Xi´´an
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    544
  • Lastpage
    547
  • Abstract
    The sine wave code density test is the most prevalent technique to estimate integral nonlinearity (INL) of ADCs. The main disadvantage of this method is that the number of samples tends to increase exponentially with the resolution of ADCs. The moving-average filtered sine wave code density test under coherent sampling condition is proposed in this paper. The proposed method needs fewer samples within the almost same accuracy of INL, and it is especially suitable to the estimation for high-resolution ADCs´ INL. The proposed method is analyzed theoretically and validated by means of simulation and experimental results.
  • Keywords
    analogue-digital conversion; circuit testing; moving average processes; ADC; coherent sampling condition; integral nonlinearity; moving-average filter; sine wave code density test; Analytical models; Chebyshev approximation; Discrete Fourier transforms; Electronic equipment testing; Electronic mail; Frequency; Information filtering; Information filters; Sampling methods; System testing; ADC Test; INL; Moving-average Filter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Electrical Engineering, 2008. ICCEE 2008. International Conference on
  • Conference_Location
    Phuket
  • Print_ISBN
    978-0-7695-3504-3
  • Type

    conf

  • DOI
    10.1109/ICCEE.2008.137
  • Filename
    4741044