DocumentCode :
2287064
Title :
Estimation for ADC´s INL Using a Moving-Average Filter
Author :
Wu, Minshun ; Chen, Guican
Author_Institution :
Sch. of Electron. & Inf. Eng., Xi´´an Jiaotong Univ., Xi´´an
fYear :
2008
fDate :
20-22 Dec. 2008
Firstpage :
544
Lastpage :
547
Abstract :
The sine wave code density test is the most prevalent technique to estimate integral nonlinearity (INL) of ADCs. The main disadvantage of this method is that the number of samples tends to increase exponentially with the resolution of ADCs. The moving-average filtered sine wave code density test under coherent sampling condition is proposed in this paper. The proposed method needs fewer samples within the almost same accuracy of INL, and it is especially suitable to the estimation for high-resolution ADCs´ INL. The proposed method is analyzed theoretically and validated by means of simulation and experimental results.
Keywords :
analogue-digital conversion; circuit testing; moving average processes; ADC; coherent sampling condition; integral nonlinearity; moving-average filter; sine wave code density test; Analytical models; Chebyshev approximation; Discrete Fourier transforms; Electronic equipment testing; Electronic mail; Frequency; Information filtering; Information filters; Sampling methods; System testing; ADC Test; INL; Moving-average Filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Electrical Engineering, 2008. ICCEE 2008. International Conference on
Conference_Location :
Phuket
Print_ISBN :
978-0-7695-3504-3
Type :
conf
DOI :
10.1109/ICCEE.2008.137
Filename :
4741044
Link To Document :
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