Title : 
Fabrication of long tip AFM probes for highly coarse samples
         
        
            Author : 
Kang, Hyen-Wook ; Kawashima, Yoshiteru ; Muramatsu, Hiroshi
         
        
            Author_Institution : 
Sch. of Biosci. & Biotechnol., Tokyo Univ. of Technol., Tokyo, Japan
         
        
        
        
        
        
            Abstract : 
A long polymeric tip has been fabricated for AFM measurements, which is able to image large and highly coarse objects such as biological and food samples. Two-photon adsorbed photo-polymerization technique provides a long polymeric tip onto a commercial cantilever. The length of the long polymeric tip was 90μm. Brown rice flours with ~3μm diameter were imaged using the fabricated long tip. The result AFM image clearly showed coarse surface, which cannot be approached by a commercial tip. Since the fabricated tip has conical structure, a clear image of brown rice flours were achieved without sharp cliff-like patterns, which imaged by the commercial pyramidal shape tip.
         
        
            Keywords : 
atomic force microscopy; cantilevers; micromechanical devices; photochemistry; polymers; AFM probe; brown rice flour; cantilever; long polymeric tip; long tip fabrication; size 90 mum; two photon adsorbed photopolymerization technique;
         
        
        
        
            Conference_Titel : 
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
         
        
            Conference_Location : 
Seoul
         
        
        
            Print_ISBN : 
978-1-4244-7033-4
         
        
            Electronic_ISBN : 
1944-9399
         
        
        
            DOI : 
10.1109/NANO.2010.5697902