DocumentCode
228738
Title
Quantitatively Modeling Application Resilience with the Data Vulnerability Factor
Author
Li Yu ; Dong Li ; Mittal, Sparsh ; Vetter, Jeffrey S.
Author_Institution
Illinois Inst. of Technol., Chicago, IL, USA
fYear
2014
fDate
16-21 Nov. 2014
Firstpage
695
Lastpage
706
Abstract
Recent strategies to improve the observable resilience of applications require the ability to classify vulnerabilities of individual components (e.g., Data structures, instructions) of an application, and then, selectively apply protection mechanisms to its critical components. To facilitate this vulnerability classification, it is important to have accurate, quantitative techniques that can be applied uniformly and automatically across real-world applications. Traditional methods cannot effectively quantify vulnerability, because they lack a holistic view to examine system resilience, and come with prohibitive evaluation costs. In this paper, we introduce a data-driven, practical methodology to analyze these application vulnerabilities using a novel resilience metric: the data vulnerability factor (DVF). DVF integrates knowledge from both the application and target hardware into the calculation. To calculate DVF, we extend a performance modeling language to provide a structured, fast modeling solution. We evaluate our methodology on six representative computational kernels, we demonstrate the significance of DVF by quantifying the impact of algorithm optimization on vulnerability, and by quantifying the effectiveness of specific hardware protection mechanisms.
Keywords
data protection; pattern classification; safety-critical software; software fault tolerance; DVF; application resilience modelling; data vulnerability factor; protection mechanism; representative computational kernel; vulnerability classification; Algorithm design and analysis; Analytical models; Computational modeling; Data models; Data structures; Hardware; Resilience;
fLanguage
English
Publisher
ieee
Conference_Titel
High Performance Computing, Networking, Storage and Analysis, SC14: International Conference for
Conference_Location
New Orleans, LA
Print_ISBN
978-1-4799-5499-5
Type
conf
DOI
10.1109/SC.2014.62
Filename
7013044
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