• DocumentCode
    2287390
  • Title

    Angular dependence of the exchange bias and the jump phenomenon

  • Author

    Bai, Yuhao ; Yun, Guohong ; Bai, Narsu

  • Author_Institution
    Coll. of Phys. Sci. & Technol., Inner Mongolia Univ., Hohhot, China
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    539
  • Lastpage
    543
  • Abstract
    Based on the principle of minimal energy, the angular dependence of exchange bias for ferromagnetic/antiferromagnetic bilayers has been investigated in detail. The competition between unidirectional and uniaxial anisotropies divides the initial magnetization state of the bilayer into monostable and bistable states, which determine the angular dependence of exchange bias directly. When the bilayer is in the bistable state, the exchange bias field and the coercivity will display a jump phenomenon at the orientation angles of the intrinsic hard axes. The jump phenomenon in the angular dependence of exchange bias has been explained by analyzing the magnetization reversal processes. The numerical calculations show that both the exchange bias field and the coercivity are larger in the magnitude at the points of the jumps. This jump phenomenon is an intrinsic property of the bilayers which is dependent on exchange coupling constant, the thickness and the uniaxial anisotropy constant of the ferromagnetic layer.
  • Keywords
    antiferromagnetic materials; coercive force; exchange interactions (electron); ferromagnetic materials; interface magnetism; magnetic anisotropy; magnetisation reversal; angular dependence; bistable state; coercivity; exchange bias field; exchange coupling constant; ferromagnetic layer; ferromagnetic-antiferromagnetic bilayers; initial magnetization state; intrinsic hard axes; intrinsic property; jump phenomenon; magnetization reversal processes; minimal energy principle; monostable state; numerical calculations; orientation angles; uniaxial anisotropy constant; unidirectional anisotropy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697917
  • Filename
    5697917