• DocumentCode
    2288861
  • Title

    Development and optimization of a novel 3-DOF precision flexure stage

  • Author

    Kim, Hyo-Young ; Ahn, Da-Hoon ; Chun, Byung-Seon ; Gweon, Dae-Gab

  • Author_Institution
    Mech. Eng. Dept., KAIST, Daejeon, South Korea
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    903
  • Lastpage
    906
  • Abstract
    This article presents a novel concept design and optimal design of an ultra-precision XYθz flexure and PZT stage with nanometer accuracy. The stage consists of a regular triangle monolithic flexure mechanism with three piezoelectric actuators, and the stage uses a parallel mechanism. Since the relationship between the variables of the hinge parameters and system performances are complicated, it is very difficult to set design variables manually. Therefore, optimal design is used. Using the optimal design results, a FEM simulation was performed. The stage was designed to simultaneously attain ±50 μm in the X and Y directions and ±0.025° in the yaw direction, and have a first resonant frequency of 207 Hz in the yaw direction. The main purpose of this novel stage is to design appropriate measurement equipment; for biological specimens in particular, the stage was designed as a hollow type and with a compact size (330 mm × 330 mm × 50 mm).
  • Keywords
    bending; finite element analysis; hinges; lead compounds; microactuators; micropositioning; nanoelectromechanical devices; nanomedicine; nanopositioning; optimisation; piezoelectric actuators; precision engineering; resonance; 3-DOF precision flexure stage design optimization; FEM simulation; PZT; PZT stage; biological specimen; frequency 207 Hz; hinge parameters; hollow type stage; measurement equipment; monolithic flexure mechanism; optimal design method; parallel mechanism; piezoelectric actuators; precision nanopositioning techniques; resonant frequency; size 330 mm; size 50 mm; ultraprecision XYθz flexure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697992
  • Filename
    5697992