DocumentCode :
2289417
Title :
Strategies for fault-tolerant, space-based computing: Lessons learned from the ARGOS testbed
Author :
Lovellette, M.N. ; Wood, K.S. ; Wood, D.L. ; Beall, J.H. ; Shirvani, P.P. ; Oh, N. ; McCluskey, E.J.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Volume :
5
fYear :
2002
fDate :
2002
Firstpage :
76458
Abstract :
The Advanced Space Computing and Autonomy Testbed on the ARGOS satellite provides the first direct, on orbit comparison of a modem radiation hardened 32 bit processor with a similar COTS processor. This investigation was motivated by the need for higher capability computers for space flight use than could be met with available radiation hardened components. The use of COTS devices for space applications has been suggested to accelerate the development cycle and produce cost effective systems. Software-implemented corrections of radiation-induced SEUs (SIHFT) can provide low-cost solutions for enhancing the reliability of these systems. We have flown two 32-bit single board computers (SBCs) onboard the ARGOS spacecraft. One is full COTS, while the other is RAD-hard. The COTS board has an order of magnitude higher computational throughput than the RAD-hard board, offsetting the performance overhead of the SIHFT techniques used on the COTS board while consuming less power.
Keywords :
aerospace computing; artificial satellites; circuit reliability; error detection; fault tolerant computing; performance evaluation; radiation hardening (electronics); space vehicle electronics; 32 bit; ARGOS satellite; ARGOS testbed; Advanced Space Computing/Autonomy Testbed; COTS IDT-3081 board; COTS processor; RH-3000 Rad-hard board; SEU susceptibility; fault-tolerant space-based computing; on orbit comparison; radiation hardened processor; radiation-induced SEUs; reliability; single board computers; single event upset susceptibility; software-implemented corrections; space flight; Acceleration; Application software; Costs; Fault tolerance; Modems; Radiation hardening; Satellites; Single event transient; Space vehicles; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference Proceedings, 2002. IEEE
Print_ISBN :
0-7803-7231-X
Type :
conf
DOI :
10.1109/AERO.2002.1035377
Filename :
1035377
Link To Document :
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