• DocumentCode
    2289447
  • Title

    Role of dimension size of patterned permalloy films in high frequency applications

  • Author

    Syed, Azeemuddin

  • Author_Institution
    Commun. Res. Center, Int. Inst. of Inf. Technol., Hyderabad, India
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    980
  • Lastpage
    982
  • Abstract
    Ferromagnetic materials have been extensively used into on-chip passive devices to improve device performance at radio frequencies (RF). A lot of work is in progress to boost up the frequency response of permalloy material in order to incorporate it with RF Inductors. One of them is control of domain dynamics. Therefore to control the domain dynamics it is important to know the factors effecting the high frequency performance. In this work, Double and Single domain permalloy bars with varying dimension sizes have been incorporated with transmission lines. The simulation and measured results show that dimension size of these patterned permalloy films play a crucial role in boosting up the frequency response. It is also observed that a particular size of permalloy bars can be used for a specific range of frequencies. As the dimension of the bar decreases maintaining same domain pattern, the frequency to which it responds can be increased. Finally, effect of surface topography on domain structures and corresponding dynamic processes is also discussed.
  • Keywords
    Permalloy; ferromagnetic materials; high-frequency effects; magnetic domains; magnetic permeability; magnetic thin films; metallic thin films; surface topography; Ni80Fe20; RF inductors; dimension size; domain pattern; ferromagnetic materials; on-chip passive devices; patterned permalloy films; surface topography; transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5698023
  • Filename
    5698023