DocumentCode
2289649
Title
On reliability growth testing
Author
Demko, Edward
Author_Institution
Grumman Melbourne Syst. Div., Melbourne, FL, USA
fYear
1995
fDate
16-19 Jan 1995
Firstpage
162
Lastpage
165
Abstract
Reliability development growth testing (RDGT) is the most common method used to improve equipment reliability. The author had an opportunity to perform an analysis of hardware that experienced environmental stress screening (ESS), environmental qualification testing (EQT), RDGT and field usage. The failure mode and corrective action data were used to qualitatively assess the effectiveness of RDGT testing. The results of this analysis yield the following conclusions: (1) RDGT is not a very good precipitator of field related failure modes, therefore RDGT alone does not appear to be a strong driver of reliability growth; (2) RDGT, EQT, ESS, and EQT tests precipitate a high percentage of failure modes that occur only in “chamber-type” environments, and are not related to field use; (3) of the three “chamber-type” tests (ESS, RDGT, and EQT) evaluated as precipitators of field related failure modes, ESS appears to be the most effective; and (4) “chamber-type” tests are more efficient in developing corrective actions than field operation
Keywords
environmental stress screening; failure analysis; reliability; testing; chamber-type environment; corrective action; environmental qualification testing; environmental stress screening; equipment reliability; failure mode; field operation; hardware; reliability development growth testing; Aerospace electronics; Electronic switching systems; Failure analysis; Hardware; Pattern analysis; Performance analysis; Performance evaluation; Qualifications; Stress; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location
Washington, DC
ISSN
0149-144X
Print_ISBN
0-7803-2470-6
Type
conf
DOI
10.1109/RAMS.1995.513241
Filename
513241
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