• DocumentCode
    2289649
  • Title

    On reliability growth testing

  • Author

    Demko, Edward

  • Author_Institution
    Grumman Melbourne Syst. Div., Melbourne, FL, USA
  • fYear
    1995
  • fDate
    16-19 Jan 1995
  • Firstpage
    162
  • Lastpage
    165
  • Abstract
    Reliability development growth testing (RDGT) is the most common method used to improve equipment reliability. The author had an opportunity to perform an analysis of hardware that experienced environmental stress screening (ESS), environmental qualification testing (EQT), RDGT and field usage. The failure mode and corrective action data were used to qualitatively assess the effectiveness of RDGT testing. The results of this analysis yield the following conclusions: (1) RDGT is not a very good precipitator of field related failure modes, therefore RDGT alone does not appear to be a strong driver of reliability growth; (2) RDGT, EQT, ESS, and EQT tests precipitate a high percentage of failure modes that occur only in “chamber-type” environments, and are not related to field use; (3) of the three “chamber-type” tests (ESS, RDGT, and EQT) evaluated as precipitators of field related failure modes, ESS appears to be the most effective; and (4) “chamber-type” tests are more efficient in developing corrective actions than field operation
  • Keywords
    environmental stress screening; failure analysis; reliability; testing; chamber-type environment; corrective action; environmental qualification testing; environmental stress screening; equipment reliability; failure mode; field operation; hardware; reliability development growth testing; Aerospace electronics; Electronic switching systems; Failure analysis; Hardware; Pattern analysis; Performance analysis; Performance evaluation; Qualifications; Stress; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1995. Proceedings., Annual
  • Conference_Location
    Washington, DC
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-2470-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1995.513241
  • Filename
    513241