• DocumentCode
    2289681
  • Title

    AMSAA maturity projection model

  • Author

    Ellner, Paul M. ; Wald, Lindalee C.

  • Author_Institution
    USAMSAA, Aberdeen Proving Ground, MD, USA
  • fYear
    1995
  • fDate
    16-19 Jan 1995
  • Firstpage
    174
  • Lastpage
    181
  • Abstract
    The AMSAA parametric empirical Bayes (PEB) projection model allows the utilization of data generated over a test period [0,T] that may include several system configurations to obtain projections of future system reliability. In this paper, the authors present a PEB reliability projection method. In general, the term “projection” refers to a reliability assessment that uses a combination of test data and engineering judgement. Engineering judgement, along with any pertinent system or lower level testing, is used to assess the effectiveness of fixes. Fix effectiveness factors are applied only to those fixes that have been implemented or that are scheduled for incorporation into the configuration whose reliability is being projected. Management frequently desires projecting the reliability of the next system configuration or at a future milestone. The projection methodology presented in this paper can be used to address these situations
  • Keywords
    Bayes methods; engineering; failure analysis; reliability; reliability theory; AMSAA parametric empirical Bayes projection model; MTBF; engineering judgement; fix effectiveness factors; management; reliability estimation; reliability projection method; test data; Costs; Data engineering; Delay effects; Failure analysis; Maximum likelihood estimation; Project management; Reliability engineering; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1995. Proceedings., Annual
  • Conference_Location
    Washington, DC
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-2470-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1995.513243
  • Filename
    513243