• DocumentCode
    2289844
  • Title

    Super-resolution from a single image

  • Author

    Glasner, Daniel ; Bagon, Shai ; Irani, Michal

  • Author_Institution
    Dept. of Comput. Sci. & Appl. Math., Weizmann Inst. of Sci., Rehovot, Israel
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    349
  • Lastpage
    356
  • Abstract
    Methods for super-resolution can be broadly classified into two families of methods: (i) The classical multi-image super-resolution (combining images obtained at subpixel misalignments), and (ii) Example-Based super-resolution (learning correspondence between low and high resolution image patches from a database). In this paper we propose a unified framework for combining these two families of methods. We further show how this combined approach can be applied to obtain super resolution from as little as a single image (with no database or prior examples). Our approach is based on the observation that patches in a natural image tend to redundantly recur many times inside the image, both within the same scale, as well as across different scales. Recurrence of patches within the same image scale (at subpixel misalignments) gives rise to the classical super-resolution, whereas recurrence of patches across different scales of the same image gives rise to example-based super-resolution. Our approach attempts to recover at each pixel its best possible resolution increase based on its patch redundancy within and across scales.
  • Keywords
    image resolution; example-based super-resolution; high resolution image patch; image scale; low resolution image patch; multiimage super-resolution; natural image; single image; subpixel misalignment; Computer science; Computer vision; Equations; Frequency; Image databases; Image reconstruction; Image resolution; Layout; Mathematics; Strontium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459271
  • Filename
    5459271