DocumentCode :
2289970
Title :
Rake transform and edge statistics for image forgery detection
Author :
Sutthiwan, Patchara ; Shi, Yun Q. ; Su, Wei ; Ng, Tian-Tsong
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
fYear :
2010
fDate :
19-23 July 2010
Firstpage :
1463
Lastpage :
1468
Abstract :
In this paper, an effective framework for passive-blind color image forgery detection is proposed. It is a combination of image features extracted from image luminance by applying a rake-transform and from image chroma by using edge statistics. The efficacy of the image features has been tested over two color image datasets established for tampering detection. The proposed framework outweighs the state of the arts over the small-scale dataset, and performs well on the newly established large-scaled dataset (likely the first reported test result on this dataset). The initial tests on some real image forgery cases available in the website and those reported in the literature on image composition with advanced image and vision technologies indicate the promise possessed as well as the challenge faced by the community of image forgery detection.
Keywords :
computer vision; feature extraction; image colour analysis; security of data; transforms; Web site; color image datasets; edge statistics; image chroma; image composition; image features extraction; image luminance; passive-blind color image forgery detection; rake transform; tampering detection; vision technology; Chromium; Color; Feature extraction; Forgery; Image edge detection; Image reconstruction; Markov processes; Rake transform; boosting feature selection; color image forgery detection; color image tampering detection; edge statistics; reconstructed image;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo (ICME), 2010 IEEE International Conference on
Conference_Location :
Suntec City
ISSN :
1945-7871
Print_ISBN :
978-1-4244-7491-2
Type :
conf
DOI :
10.1109/ICME.2010.5583264
Filename :
5583264
Link To Document :
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