DocumentCode :
2290277
Title :
Growth of III-Nitride quantum structures for device applications
Author :
Nikishin, Sergey ; Holtz, Mark
Author_Institution :
Nano Tech Center, Texas Tech Univ., Lubbock, TX, USA
fYear :
2010
fDate :
17-20 Aug. 2010
Firstpage :
31
Lastpage :
36
Abstract :
Using GSMBE with ammonia on (0001) sapphire substrates, AlN/AlGaN nanostructured short period superlattices (SPSLs), with respective well and barrier thickness from 0.5 to 1 nm and from 0.75 to 1.5 nm, have been shown to have energy gaps in the deep UV suitable for light emitting diodes (LEDs) and photodetectors (PDs) operating down to 247 nm. Performance of LEDs and PDs is limited by factors including efficiency of radiative recombination and absorption in the active region and electrical resistivity of p-type wide bandgap SPSLs. Based on MOVPE, we have used selective area epitixy (SAE) to grow InGaN/GaN quantum structures. By patterning SiO2 hard mask materials on planar sapphire substrates, we have grown various shapes including pyramidal stripes with InxGa1-xN multiple quantum wells. The structures at the apex are found to have very high In content with corresponding optical emission in the green wavelength range and excellent uniformity.
Keywords :
III-V semiconductors; aluminium compounds; electrical resistivity; energy gap; gallium compounds; light emitting diodes; luminescence; molecular beam epitaxial growth; nanostructured materials; photodetectors; semiconductor growth; semiconductor superlattices; wide band gap semiconductors; AlN-AlGaN; GSMBE; LED; SiO2; device applications; electrical resistivity; energy gap; gas source molecular beam epitaxy; green wavelength range; hard mask materials; light emitting diodes; nanostructured short period superlattices; optical emission; p-type wide bandgap SPSL; photodetectors; pyramidal stripes; quantum structure growth; radiative recombination; selective area epitaxy; size 0.5 nm to 1.5 nm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
ISSN :
1944-9399
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2010.5698066
Filename :
5698066
Link To Document :
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