• DocumentCode
    2290371
  • Title

    Formal verification and performance evaluation of logic integrated systems based on hierarchical analysis

  • Author

    El-Licy, Fatma A. ; Abdel-Aty-Zohdy, Hoda S.

  • Author_Institution
    Dept. of Electr. & Syst. Eng., Oakland Univ., Rochester, MI, USA
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    651
  • Abstract
    Formal verification of very large scale integrated circuit (VLSIC) involves the formal correctness of the functionality of a given design, while circuit validation involves the reliability and efficiency of the design. A hierarchical approach for computation, of IC design efficiency is proposed and implemented using figures of merit. The work has been motivated to partially complete an IC formal verification tool. The implemented system is integrated into a formal verification environment to reflect the performance of the verified system. The system is capable of analyzing the power dissipation and figures of merit using equivalent R and C components. The hierarchical analysis and evaluation of figures of merit general factors obtained at different system levels represent performance evaluation of each gate. An illustrative example of a 6×6 carry look-ahead adder is given and worst case conditions have been determined. The system performance may thus be improved
  • Keywords
    VLSI; adders; carry logic; circuit CAD; delays; formal verification; integrated circuit design; integrated logic circuits; logic CAD; low-power electronics; VLSIC; carry look-ahead adder; design efficiency; figures of merit; formal correctness; formal verification; hierarchical analysis; logic integrated systems; performance evaluation; power dissipation; Binary trees; CMOS logic circuits; Delay effects; Formal verification; Laboratories; Logic design; Performance analysis; Power dissipation; Semiconductor device modeling; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2001. MWSCAS 2001. Proceedings of the 44th IEEE 2001 Midwest Symposium on
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-7150-X
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2001.986273
  • Filename
    986273