Title :
Combining single-event latchup and reliability requirements for space vehicles
Author :
Willing, Walter E. ; Goldstein, Norman P.
Author_Institution :
Westinghouse Electr. Corp., Baltimore, MD, USA
Abstract :
In this paper, the authors suggest the consideration of destructive single-event latchup (SEL) as an additional failure mode for components in space systems. With this orientation, the failure rate for this process can be combined with the standard failure analysis to obtain a composite failure rate prediction. This paper shows how SEL can be included in the standard reliability formalism and how this connection can be used to derive realistic specifications for the allowable SEL rate in a given satellite system
Keywords :
failure analysis; reliability; reliability theory; space vehicles; composite failure rate prediction; destructive single-event latchup; failure mode; failure rate; reliability; satellite; space systems; space vehicles; specifications; Cosmic rays; Costs; Degradation; Electronic components; Failure analysis; Integrated circuit reliability; Ionizing radiation; Radiation effects; Single event upset; Space vehicles;
Conference_Titel :
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2470-6
DOI :
10.1109/RAMS.1995.513282
