DocumentCode :
2290518
Title :
Impact of hardware and software faults on ARQ schemes-an experimental study
Author :
Jagannath, Ajeeth ; Rai, Suresh
Author_Institution :
Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
fYear :
1995
fDate :
16-19 Jan 1995
Firstpage :
479
Lastpage :
485
Abstract :
An understanding of the impact of hardware and software faults (HSFs) on any application is critical to the design of efficient software fault tolerance techniques. This paper considers HSFs and, by using a fault injection experiment, studies their impact on an automatic repeat request (ARQ) scheme in terms of throughput degradation. An ARQ scheme is used for error control in computer networks and is implemented in the data link layer. Our study shows that even in the absence of errors in the communication channel the throughput may be degraded with HSFs. Furthermore, we need to identify certain critical variables as locations for fault injection thereby elevating the fault models to a higher level of abstraction. The variables lie in the active path of the program and help accelerate the failure process. This results in fewer runs being needed in conducting the fault injection experiment. Since the accelerated failure process represents the worst case scenario for the fault models considered, the experiences would enable the fault tolerance engineer in designing/choosing fault tolerance mechanisms
Keywords :
automatic repeat request; computer network reliability; failure analysis; fault diagnosis; software fault tolerance; ARQ schemes; automatic repeat request scheme; communication channel; computer networks; data link layer; error control; failure process; fault injection experiment; fault models; hardware faults; software fault tolerance techniques; software faults; Acceleration; Application software; Automatic repeat request; Computer networks; Degradation; Error correction; Fault tolerance; Hardware; Software design; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location :
Washington, DC
ISSN :
0149-144X
Print_ISBN :
0-7803-2470-6
Type :
conf
DOI :
10.1109/RAMS.1995.513288
Filename :
513288
Link To Document :
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