• DocumentCode
    2290518
  • Title

    Impact of hardware and software faults on ARQ schemes-an experimental study

  • Author

    Jagannath, Ajeeth ; Rai, Suresh

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
  • fYear
    1995
  • fDate
    16-19 Jan 1995
  • Firstpage
    479
  • Lastpage
    485
  • Abstract
    An understanding of the impact of hardware and software faults (HSFs) on any application is critical to the design of efficient software fault tolerance techniques. This paper considers HSFs and, by using a fault injection experiment, studies their impact on an automatic repeat request (ARQ) scheme in terms of throughput degradation. An ARQ scheme is used for error control in computer networks and is implemented in the data link layer. Our study shows that even in the absence of errors in the communication channel the throughput may be degraded with HSFs. Furthermore, we need to identify certain critical variables as locations for fault injection thereby elevating the fault models to a higher level of abstraction. The variables lie in the active path of the program and help accelerate the failure process. This results in fewer runs being needed in conducting the fault injection experiment. Since the accelerated failure process represents the worst case scenario for the fault models considered, the experiences would enable the fault tolerance engineer in designing/choosing fault tolerance mechanisms
  • Keywords
    automatic repeat request; computer network reliability; failure analysis; fault diagnosis; software fault tolerance; ARQ schemes; automatic repeat request scheme; communication channel; computer networks; data link layer; error control; failure process; fault injection experiment; fault models; hardware faults; software fault tolerance techniques; software faults; Acceleration; Application software; Automatic repeat request; Computer networks; Degradation; Error correction; Fault tolerance; Hardware; Software design; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1995. Proceedings., Annual
  • Conference_Location
    Washington, DC
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-2470-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1995.513288
  • Filename
    513288