Title :
Advanced models for backscattering from rough surfaces
Author :
Fung, Adrian K. ; Tjuatja, Saibun
Author_Institution :
Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
fDate :
30 Sept.-4 Oct. 2003
Abstract :
In surface scattering model applications a large variety of roughness conditions are encountered: some surfaces may be described with one roughness scale and others with more than one roughness scales; some surfaces are correlated exponentially, Gaussian-like or anywhere between the two. In this study we want to show two backscattering models in algebraic form: (1) a scattering model whose correlation function behaves like a Gaussian or an exponential function, and (2) a scattering model whose correlation function behaves like a Gaussian near the origin and nearly an exponential function at large lag distances. It is believed that most surface backscattering problems can be explained with one of the two models. Applications of these models to data interpretation are demonstrated.
Keywords :
Gaussian processes; backscatter; correlation theory; electromagnetic wave scattering; integral equations; radiowave propagation; rough surfaces; Gaussian-like correlation; backscattering model; data interpretation; exponential correlation; roughness condition; surface scattering model; Backscatter; Frequency estimation; Fresnel reflection; Gaussian processes; Integral equations; Rough surfaces; Scattering; Surface roughness; Surface waves; USA Councils;
Conference_Titel :
Integration of Knowledge Intensive Multi-Agent Systems, 2003. International Conference on
Print_ISBN :
0-7803-7958-6
DOI :
10.1109/KIMAS.2003.1245117