DocumentCode :
2290862
Title :
Robust matching of building facades under large viewpoint changes
Author :
Lee, Jimmy Addison ; Yow, Kin-Choong ; Chia, Alex Yong-Sang
Author_Institution :
Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2009
fDate :
Sept. 29 2009-Oct. 2 2009
Firstpage :
1258
Lastpage :
1264
Abstract :
This paper presents a novel approach to finding point correspondences between images of building facades with wide viewpoint variations, and at the same time returning a large list of true matches between the images. Such images comprise repetitive and symmetric patterns, which render popular algorithms e.g., SIFT to be ineffective. Feature descriptors such as SIFT that are based on region patches are also unstable under large viewing angle variations. In this paper, we integrate both the appearance and geometric properties of an image to find unique matches. First we extract hypotheses of building facades based on a robust line fitting algorithm. Each hypothesis is defined by a planar convex quadrilateral in the image, which we call a “q-region”, and the four corners of each q-region provide the inputs from which a projective transformation model is derived. Next, a set of interest points are extracted from the images and are used to evaluate the correctness of the transformation model. The transformation model with the largest set of matched interest points is selected as the correct model, and this model also returns the best pair of corresponding q-regions and the most number of point correspondences in the two images. Extensive experimental results demonstrate the robustness of our approach in which we achieve a tenfold increase in true matches when compared to state of the art techniques such as SIFT and MSER.
Keywords :
computer vision; edge detection; feature extraction; image matching; object recognition; MSER; SIFT; building facade robust matching; feature descriptors; geometric properties; large viewing angle variations; large viewpoint changes; planar convex quadrilateral; point correspondences; projective transformation model; robust line fitting algorithm; state of the art techniques; symmetric patterns; wide viewpoint variations; Buildings; Computer vision; Detectors; Entropy; Feature extraction; Object detection; Object recognition; Pattern matching; Rendering (computer graphics); Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision, 2009 IEEE 12th International Conference on
Conference_Location :
Kyoto
ISSN :
1550-5499
Print_ISBN :
978-1-4244-4420-5
Electronic_ISBN :
1550-5499
Type :
conf
DOI :
10.1109/ICCV.2009.5459324
Filename :
5459324
Link To Document :
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