• DocumentCode
    2290897
  • Title

    ARM 1176 implementation in SOI 45nm technology and silicon measurement

  • Author

    Pottier, Remy ; Tong, Jonathan ; Hawkins, Chris ; Kundu, Roma ; Pelloie, Jean-Luc

  • Author_Institution
    ARM, Grenoble, France
  • fYear
    2009
  • fDate
    5-8 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper demonstrates the strong power savings of IBM´s commercially available 45 nm high performance SOI technology on a standard ARM core compared with bulk CMOS low power technology. The benefits are shown for a typical design point for an ARM 11 implementation in mobile phone application. The implementation used standard SOI libraries from ARM and EDA tools.
  • Keywords
    integrated circuit design; integrated circuit measurement; integrated circuit testing; microprocessor chips; mobile radio; silicon-on-insulator; ARM 1176 implementation; EDA tools; IBM; SOI technology; SOI test chip design; bulk CMOS low power technology; mobile phone application; silicon measurement; size 45 nm; standard ARM core; standard SOI libraries; CMOS technology; Electronic design automation and methodology; Frequency; Logic design; Measurement standards; Power measurement; Semiconductor device measurement; Silicon; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 2009 IEEE International
  • Conference_Location
    Foster City, CA
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-4244-4256-0
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2009.5318733
  • Filename
    5318733
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2290897