• DocumentCode
    2291839
  • Title

    Overview of SOI technologies in China

  • Author

    Chen, M. ; Wang, Y.B.

  • Author_Institution
    Shanghai Simgui Technol. Co., Ltd., Shanghai, China
  • fYear
    2009
  • fDate
    5-8 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Since the early 1980s, SOI technologies have been developed in China, where SIMOX, BESOI and SIMBOND are three main SOI materials technologies commercialized so far. In order to cut down the production cost, one has been trying to improve SIMOX technology by optimizing dose energy match to obtain high quality low-dose SIMOX wafer. By the end of 2005, BESOI SOI pilot line has been established and a new technology named SIMBOND technology has come to birth. Some innovative structures, like SiGe on insulator (SGOI) material, Strain Silicon on insulator (SSOI), AlN buried layer have also been investigated. Some commercial IC manufacturers start to design and produce SOI-based devices since 2002, when Shanghai Simgui Technology Co.,Ltd., was able to produced 100 mm, 125 mm and 150 mm SIMOX wafers and sold them to the semiconductor industry worldwide. This paper presents an outlook, the recent status and future prospect of SOI technologies in China.
  • Keywords
    SIMOX; buried layers; integrated circuit design; integrated circuit manufacture; semiconductor industry; BESOI; China; IC design; SIMBOND; SIMOX; SOI technology; Shanghai Simgui Technology; Si-SiO2; semiconductor industry; size 100 mm; size 125 mm; size 150 mm; strain silicon-on-insulator; Capacitive sensors; Commercialization; Cost function; Germanium silicon alloys; Insulation; Materials science and technology; Optimized production technology; Semiconductor materials; Silicon germanium; Silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 2009 IEEE International
  • Conference_Location
    Foster City, CA
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-4244-4256-0
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2009.5318787
  • Filename
    5318787