DocumentCode
2292038
Title
Fast stereo matching using multilevel enhancement
Author
Kim, Jaeweon ; Shah, Shishir
Author_Institution
Dept. of Electr. & Comput. Eng., Wayne State Univ., Detroit, MI, USA
Volume
2
fYear
2000
fDate
10-13 July 2000
Abstract
Presents a new approach for fast and accurate stereo correspondence. We address some of the efficient and robust implementation aspects of stereo matching algorithms based on thresholding the correlation values of previous pyramid structures that reduce the search area for finding the best matching point. The disparity for each scan line is chosen by selecting the position that gives the maximum correlation coefficient from the pyramid structure. However, sometimes this maximum value may be overridden by a spurious maximum. The ambiguities mainly come from image noise, lack of intensity variation or geometric distortion. For disambiguation, the adaptive window theory is applied to avoid mismatches in featureless areas. Adjusting the threshold parameter at each level of the pyramid structure reduces the computation time and increases the accuracy for the next pyramid level. Both synthetic and real image sets have been tested, and good results have been obtained.
Keywords
correlation methods; image enhancement; image matching; sensor fusion; stereo image processing; accuracy; adaptive window theory; ambiguities; best matching point; computation time; correlation coefficient; correlation value thresholding; disambiguation; featureless areas; geometric distortion; image matching; image noise; intensity variation; mismatches; multi-level enhancement; pyramid structures; scan-line disparity; search area reduction; spurious maximum; stereo correspondence; stereo matching algorithms; threshold parameter; Acoustic reflection; Eyes; Image analysis; Image segmentation; Layout; Pixel; Robustness; Shape; Testing; Two dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Fusion, 2000. FUSION 2000. Proceedings of the Third International Conference on
Conference_Location
Paris, France
Print_ISBN
2-7257-0000-0
Type
conf
DOI
10.1109/IFIC.2000.859825
Filename
859825
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