• DocumentCode
    2293109
  • Title

    Shape guided contour grouping with particle filters

  • Author

    Lu, ChengEn ; Latecki, Longin Jan ; Adluru, Nagesh ; Yang, Xingwei ; Ling, Haibin

  • Author_Institution
    Electron. & Inf. Eng. Dept., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    2288
  • Lastpage
    2295
  • Abstract
    We propose a novel framework for contour based object detection and recognition, which we formulate as a joint contour fragment grouping and labeling problem. For a given set of contours of model shapes, we simultaneously perform selection of relevant contour fragments in edge images, grouping of the selected contour fragments, and their matching to the model contours. The inference in all these steps is performed using particle filters (PF) but with static observations. Our approach needs one example shape per class as training data. The PF framework combined with decomposition of model contour fragments to part bundles allows us to implement an intuitive search strategy for the target contour in a clutter of edge fragments. First a rough sketch of the model shape is identified, followed by fine tuning of shape details. We show that this framework yields not only accurate object detections but also localizations in real cluttered images.
  • Keywords
    object detection; object recognition; particle filtering (numerical methods); shape recognition; cluttered images; contour based object detection; contour based object recognition; contour fragment grouping problem; contour fragment labeling problem; edge fragments; edge images; intuitive search strategy; model contour fragments; object localization; particle filters; shape guided contour grouping; target contour; Computer vision; Humans; Image edge detection; Image recognition; Labeling; Object detection; Particle filters; Shape; Training data; Visual perception;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459446
  • Filename
    5459446