• DocumentCode
    2293404
  • Title

    Frequency-swapping aided femtocells in twin-layer cellular networks relying on fractional frequency reuse

  • Author

    Jin, Fan ; Zhang, Rong ; Hanzo, Lajos

  • Author_Institution
    Sch. of ECS, Univ. of Southampton, Southampton, UK
  • fYear
    2012
  • fDate
    1-4 April 2012
  • Firstpage
    3097
  • Lastpage
    3101
  • Abstract
    Femtocells constitute an economical solution conceived for improving the indoor coverage, which are capable of achieving a high network capacity. In order to guarantee a high Area Spectral Efficiency (ASE), femtocells have to reuse the spectrum of macrocells. As a result, the performance of both the femtocells and macrocells may suffer owing to the near-far effects. In this paper, we investigate the Outage Probability (OP) of twin-layer cellular networks, where the Macrocell Base Stations (MBSs) employing Fractional Frequency Reuse (FFR) host the Femtocell Base Stations (FBSs). More explicitly, the frequency-swapping aided femtocell concept is proposed for overcoming the typical near-far problem. We derive the approximate closed-form expressions for the DownLink (DL) OP for both our benchmarker as well as for our proposed solution. Our analysis demonstrates that the OP of femtocell users in the Cell Centre Region (CCR) and that of the macrocell users in the Cell Edge Region (CER) will be reduced by the proposed swapped-spectrum access policy.
  • Keywords
    femtocellular radio; Cell Centre Region; Cell Edge Region; DownLink OP; FBS; FFR; MBS; femtocell base stations; fractional frequency reuse; frequency-swapping aided femtocells; high area spectral efficiency; macrocell base stations; macrocells spectrum; near-far effects; outage probability; swapped-spectrum access policy; twin-layer cellular networks; Benchmark testing; Femtocells; Interference; Macrocell networks; OFDM; Radio frequency; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications and Networking Conference (WCNC), 2012 IEEE
  • Conference_Location
    Shanghai
  • ISSN
    1525-3511
  • Print_ISBN
    978-1-4673-0436-8
  • Type

    conf

  • DOI
    10.1109/WCNC.2012.6214337
  • Filename
    6214337