Title :
Practical stability of perturbed event-driven controlled linear systems
Author :
Heemels, W.P.M.H. ; Sanded, J.H.
Author_Institution :
Embedded Syst. Inst., Eindhoven
Abstract :
Many plants are regulated by digital controllers that run at a constant sampling frequency, thereby requiring a high processor load for the computations. To guarantee a good control performance, such a high sampling frequency might be required at some periods of time, but not necessarily continuously. By using an event-driven control scheme that triggers the update of the control value only when the (tracking or stabilization) error is large, the average processor load can be reduced considerably. Although event-driven control can be effective from a CPU-load perspective, the analysis of such control schemes is much more involved than that of conventional schemes and is a widely open research area. This paper investigates the control performance of an event-driven controlled continuous-time linear system with additive disturbances in terms of practical stability (ultimate boundedness). By using the derived results, the event-driven controller can be tuned to get satisfactorily transient behavior and desirable ultimate bounds, while reducing the required average processor load for its implementation. Several examples illustrate the theory
Keywords :
continuous time systems; digital control; discrete time systems; linear systems; perturbation techniques; piecewise linear techniques; sampled data systems; stability; CPU-load; digital controller; high sampling frequency; perturbed event-driven controlled continuous-time linear system; piecewise linear system; practical stability; processor load; robust invariance; sampled-data control; transient behavior; ultimate boundedness; Control systems; Digital control; Embedded system; Error correction; Frequency; Linear systems; Process control; Robust control; Robust stability; Sampling methods;
Conference_Titel :
American Control Conference, 2006
Conference_Location :
Minneapolis, MN
Print_ISBN :
1-4244-0209-3
Electronic_ISBN :
1-4244-0209-3
DOI :
10.1109/ACC.2006.1657408