Title :
On high frequency/mm-wave IMD measurements with small tone spacing
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
Abstract :
Small-tone-spacing intermodulation distortion (IMD) measurements, needed for some memory-effect modeling studies in particular, are traditionally challenging because of the stresses on source phase noise, isolation, measurement system memory effects and dynamic range. These effects are exacerbated in broadband and mm-wave measurements due to (typically) more frequency multiplication and reduced source chain isolation. Through a series of studies on automatic level control (ALC) bandwidth modulation, isolation effects, source coherence improvements and receiver memory control, an improved system will be presented having residual measurement system third-order intercept products (IP3) in excess of 25 dBm at 70 GHz and >20 dBm at 110 GHz with a 100 Hz tone spacing.
Keywords :
intermodulation distortion; intermodulation measurement; measurement systems; millimetre wave measurement; phase noise; ALC bandwidth modulation; IP3; automatic level control; broadband measurement; dynamic range; frequency 110 GHz; frequency multiplication; high-frequency IMD measurement; intermodulation distortion; isolation effects; measurement system memory effect modeling; mm-wave IMD measurement; receiver memory control; residual measurement system; small tone spacing; source coherence improvement; source phase noise; third order intercept products; Bandwidth; Floors; Frequency measurement; Noise measurement; Phase measurement; Phase noise; Receivers; Intermodulation distortion; measurement; memory effects;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 84th ARFTG
Conference_Location :
Boulder, CO
DOI :
10.1109/ARFTG.2014.7013407