• DocumentCode
    2294634
  • Title

    An observability-based code coverage metric for functional simulation

  • Author

    Devadas, S. ; Ghosh, A. ; Keutzer, K.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • fYear
    1996
  • fDate
    10-14 Nov. 1996
  • Firstpage
    418
  • Lastpage
    425
  • Abstract
    Functional simulation is the most widely used method for design verification. At various levels of abstraction, e.g., behavioral, register-transfer level and gate level, the designer simulates the design using a large number of vectors attempting to debug and verify the design. A major problem with functional simulation is the lack of good metrics and tools to evaluate the quality of a set of functional vectors. Metrics used currently are based on instruction counts and are quite simplistic. Designers are forced to use ad-hoc methods to terminate functional simulation, e.g., CPU time limitations, We propose a new metric for measuring the extent of design verification provided by a set of functional simulation vectors. This metric is universal, and can be used uniformly for all designs. Our metric computes observability information to determine whether effects of errors that are activated by the program stimuli can be observed at the circuit outputs. We provide preliminary experimental evidence that supports the validity of the proposed metric. We believe that using this metric in design verification will result in higher-quality functional tests and improved correctness checking.
  • Keywords
    formal verification; logic CAD; observability; code coverage metric; correctness checking; design verification; functional simulation; functional simulation vectors; functional tests; observability-based; Circuit faults; Circuit simulation; Computational modeling; Design methodology; Formal verification; Logic testing; Observability; Research and development; Software testing; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-8186-7597-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.1996.569832
  • Filename
    569832