Title :
The evaluation of full sensitivity for test generation in MVL circuits
Author :
Dubrova, E.V. ; Gurov, D.B. ; Muzio, J.C.
Author_Institution :
Dept. of Comput. Sci., Victoria Univ., BC, Canada
Abstract :
The evaluation of a method for test generation for MVL circuits, based on the notion of full sensitivity, is given. The estimation is made on the functional level, by establishing a lower bound on the number of m-valued n-variable functions that are fully sensitive to all their variables. It is shown, that for practical values of m and n, the fraction of functions not fully sensitive to all their variables is extremely small. The consequences of this result in terms of test generation are discussed
Keywords :
circuit analysis computing; fault diagnosis; logic testing; multivalued logic circuits; MVL circuits; full sensitivity evaluation; functional level; m-valued n-variable functions; multi-valued logic circuits; test generation; Boolean algebra; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Computer science; Integrated circuit testing; Logic testing;
Conference_Titel :
Multiple-Valued Logic, 1995. Proceedings., 25th International Symposium on
Conference_Location :
Bloomington, IN
Print_ISBN :
0-8186-7118-1
DOI :
10.1109/ISMVL.1995.513517
