• DocumentCode
    2296358
  • Title

    Classification between PS and Stego Images Based on Noise Model

  • Author

    He, Xiongfei ; Liu, Fenlin ; Luo, Xiangyang ; Yang, Chunfang

  • Author_Institution
    Inst. of Inf. Sci. & Technol., Zhengzhou, China
  • fYear
    2009
  • fDate
    4-6 June 2009
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    Owing to the popular usage of Photoshop, PS images which are processed by Photoshop or other similar software nowadays emerge increasingly. PS images may be misfortunes to steganalysis. The similarities and differences between PS and stego images are analyzed in this paper, and a method is proposed to classify the natural, PS and stego images. The first-scale diagonal subband obtained by wavelet transform is decomposed, and then the diagonal decomposed subband is decomposed again, the statistical moments of characteristic function (CF) of the image and its wavelet subbands are selected as features. Artificial neural network is utilized as the classifier. Extensive experimental results showed that the proposed method can classify natural images, common PS images and typical stego images reliable. Further more, the sharpening and contrast enhancement images can also be classified.
  • Keywords
    feature extraction; image classification; image enhancement; neural nets; noise; statistical analysis; steganography; wavelet transforms; PS image classification; Photoshop; artificial neural network; characteristic function; diagonal decomposed subband; feature selection; image enhancement; noise model; statistical moment; stego image; wavelet transform; Additive noise; Artificial neural networks; Helium; Image analysis; Image processing; Information science; Splicing; Statistics; Steganography; Wavelet transforms; PS image; Steganalysis; Steganography; digital forensic; noise model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Ubiquitous Engineering, 2009. MUE '09. Third International Conference on
  • Conference_Location
    Qingdao
  • Print_ISBN
    978-0-7695-3658-3
  • Type

    conf

  • DOI
    10.1109/MUE.2009.16
  • Filename
    5319063