• DocumentCode
    2296363
  • Title

    Race-hazard and skip-hazard in multivalued combinational circuits

  • Author

    Wu, Xunwei ; Chen, Xiexiong ; Shen, Jihong

  • Author_Institution
    Dept. of Electron. Eng., Hangzhou Univ., China
  • fYear
    1995
  • fDate
    23-25 May 1995
  • Firstpage
    222
  • Lastpage
    227
  • Abstract
    The paper discusses race hazards based on AND/OR expression of functions in multivalued combinational circuits, and proposes techniques for eliminating race hazards by algebraic and K map´s means. Furthermore, the paper analyzes the skip hazard, another inherent hazard in multivalued circuits, and points out that it is a normal response for multivalued circuits. They can be restrained by using the input signals with fast transition or a small load capacitor
  • Keywords
    combinational circuits; hazards and race conditions; multivalued logic circuits; AND/OR expression; fast transition; input signals; multivalued circuits; multivalued combinational circuits; race hazards; race-hazard; skip hazard; skip-hazard; small load capacitor; Capacitors; Circuit analysis; Combinational circuits; Hazards; Logic circuits; Logic design; Multivalued logic; Pins; Signal analysis; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multiple-Valued Logic, 1995. Proceedings., 25th International Symposium on
  • Conference_Location
    Bloomington, IN
  • ISSN
    0195-623X
  • Print_ISBN
    0-8186-7118-1
  • Type

    conf

  • DOI
    10.1109/ISMVL.1995.513535
  • Filename
    513535