Title :
Cost effective digital filter design for concurrent test
Author :
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
Invariant-based concurrent test schemes can provide economical solutions to the problem of concurrent testing of digital filters. Design methodologies for digital filters ensuring concurrent testability are outlined. Experimental results confirm through fault simulation 100% fault coverage within area cost comparable to that of DfT for off-line test and with error detection latency well below human response times
Keywords :
circuit testing; design for testability; digital filters; network synthesis; concurrent test; concurrent testability; cost effective digital filter design; design methodologies; fault coverage; fault simulation; invariant-based concurrent test schemes; Computer science; Concurrent computing; Costs; Delay; Design methodology; Digital filters; Fault detection; Fault diagnosis; Humans; Testing;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 2000. ICASSP '00. Proceedings. 2000 IEEE International Conference on
Conference_Location :
Istanbul
Print_ISBN :
0-7803-6293-4
DOI :
10.1109/ICASSP.2000.860111
