DocumentCode
2296536
Title
Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273)
fYear
1998
fDate
5-7 Oct. 1998
Abstract
Presents the front cover of the conference proceedings.
Keywords
VLSI; automatic test pattern generation; built-in self test; field programmable gate arrays; formal verification; high level synthesis; logic design; microprocessor chips; ARM microprocessor; ATPG; Alpha 21264 microprocessor; VLSI; asynchronous design techniques; built in self test; cache; design optimisation; formal verification; functional verification; high level synthesis; high performance design techniques; logic synthesis; memory systems; microarchitecture; mixed signal testing; performance analysis; prototype 1 GHz PowerPC microprocessor; routing; system performance issues;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
Conference_Location
Austin, TX, USA
ISSN
1063-6404
Print_ISBN
0-8186-9099-2
Type
conf
DOI
10.1109/ICCD.1998.727015
Filename
727015
Link To Document