• DocumentCode
    2297103
  • Title

    A Cost-Effective FPGA-based Fault Simulation Environment

  • Author

    Janning, Angelika ; Heyszl, Johann ; Stumpf, Frederic ; Sigl, Georg

  • Author_Institution
    Fraunhofer Res. Instn. AISEC, Munich, Germany
  • fYear
    2011
  • fDate
    28-28 Sept. 2011
  • Firstpage
    21
  • Lastpage
    31
  • Abstract
    In this contribution, we present an FPGA-based simulation environment for fault attacks on cryptographic hardware designs. With our methodology, we are able to simulate the effects of global fault attacks from e.g., spikes and local attacks from e.g., focused laser beams. The environment simulates transient bit-flip faults in sequential elements of a digital design. In this way it is tailored to the simulation of fault attacks on cryptographic designs. It is a tool to verify the design´s behaviour in case of fault attacks and to verify implemented countermeasures. The environment is script-based for fully automated modification of the digital design and simulation. It can handle designs in VHDL as well as in Verilog language and does not require modifications to the design´s source code. We used our environment in a case study and successfully tested the effectiveness of a fault detection countermeasure in an elliptic curve cryptography design.
  • Keywords
    digital simulation; field programmable gate arrays; hardware description languages; logic design; public key cryptography; FPGA-based fault simulation environment; VHDL; Verilog language; bit-flip faults; cryptographic hardware designs; digital design; elliptic curve cryptography design; global fault attacks; local attacks; spike attacks; Circuit faults; Computational modeling; Elliptic curve cryptography; Field programmable gate arrays; Hardware; Logic gates; ECC case study; FPGA; Xilinx; cryptographic implementations simulation; fault attack; low-cost;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault Diagnosis and Tolerance in Cryptography (FDTC), 2011 Workshop on
  • Conference_Location
    Nara
  • Print_ISBN
    978-1-4577-1463-4
  • Type

    conf

  • DOI
    10.1109/FDTC.2011.19
  • Filename
    6076464