Analysis and Measurement of Capacitive Coupling in Integrated Circuits

Author

Novak, J. ; Foit, J. ; Janicek, V.

Author_Institution

Dept. of Microelectron., Czech Tech. Univ. in Prague, Prague

fYear

2008

fDate

12-16 Oct. 2008

Firstpage

223

Lastpage

226

Abstract

Parasitic electromagnetic couplings result in the transfer of interfering energy from the interference source to the interference receiver. Inside the IC´s the principal sources of interference are usually the clock circuits, output drivers and other circuits with low output impedance. The most frequent receivers of interference are the input circuits, flip-flops and circuits with high input impedance. The small distances of leads result in increased signal crosstalk inside the integrated circuit.

Keywords

coupled circuits; integrated circuit measurement; interference (signal); capacitive coupling; clock circuits; flip-flops; input circuits; integrated circuits; interference receiver; interference source; output drivers; parasitic electromagnetic couplings; signal crosstalk; Clocks; Coupling circuits; Crosstalk; Driver circuits; Electromagnetic coupling; Electromagnetic interference; Electromagnetic measurements; Flip-flops; Impedance; Integrated circuit measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Semiconductor Devices and Microsystems, 2008. ASDAM 2008. International Conference on

Conference_Location

Smolenice

Print_ISBN

978-1-4244-2325-5

Electronic_ISBN

978-1-4244-2326-2

Type

conf

DOI

10.1109/ASDAM.2008.4743322

Filename

4743322