DocumentCode :
2297180
Title :
Antirandom vs. pseudorandom testing
Author :
Wu, ShenHui ; Malaiya, Yashwant K. ; Jayasuman, A.P.
Author_Institution :
Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
fYear :
1998
fDate :
5-7 Oct 1998
Firstpage :
221
Lastpage :
223
Abstract :
This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. This strategy results in a higher fault coverage when the number of vectors that are applied is limited. Results on several ISCAS benchmarks show this strategy to be very effective when a high fault coverage needs to be achieved with a limited number of test vectors. The superiority of the antirandom testing approach is even more significant for testing bridging faults
Keywords :
logic testing; ISCAS benchmarks; antirandom testing; bridging faults; pseudorandom testing; test vector space; Circuit faults; Circuit testing; Equations; Fault detection; Hamming distance; High definition video; Monitoring; Read only memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-8186-9099-2
Type :
conf
DOI :
10.1109/ICCD.1998.727054
Filename :
727054
Link To Document :
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