Title :
Antirandom vs. pseudorandom testing
Author :
Wu, ShenHui ; Malaiya, Yashwant K. ; Jayasuman, A.P.
Author_Institution :
Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
Abstract :
This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. This strategy results in a higher fault coverage when the number of vectors that are applied is limited. Results on several ISCAS benchmarks show this strategy to be very effective when a high fault coverage needs to be achieved with a limited number of test vectors. The superiority of the antirandom testing approach is even more significant for testing bridging faults
Keywords :
logic testing; ISCAS benchmarks; antirandom testing; bridging faults; pseudorandom testing; test vector space; Circuit faults; Circuit testing; Equations; Fault detection; Hamming distance; High definition video; Monitoring; Read only memory;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-9099-2
DOI :
10.1109/ICCD.1998.727054