• DocumentCode
    2297180
  • Title

    Antirandom vs. pseudorandom testing

  • Author

    Wu, ShenHui ; Malaiya, Yashwant K. ; Jayasuman, A.P.

  • Author_Institution
    Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
  • fYear
    1998
  • fDate
    5-7 Oct 1998
  • Firstpage
    221
  • Lastpage
    223
  • Abstract
    This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. This strategy results in a higher fault coverage when the number of vectors that are applied is limited. Results on several ISCAS benchmarks show this strategy to be very effective when a high fault coverage needs to be achieved with a limited number of test vectors. The superiority of the antirandom testing approach is even more significant for testing bridging faults
  • Keywords
    logic testing; ISCAS benchmarks; antirandom testing; bridging faults; pseudorandom testing; test vector space; Circuit faults; Circuit testing; Equations; Fault detection; Hamming distance; High definition video; Monitoring; Read only memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-8186-9099-2
  • Type

    conf

  • DOI
    10.1109/ICCD.1998.727054
  • Filename
    727054