DocumentCode
2297180
Title
Antirandom vs. pseudorandom testing
Author
Wu, ShenHui ; Malaiya, Yashwant K. ; Jayasuman, A.P.
Author_Institution
Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
fYear
1998
fDate
5-7 Oct 1998
Firstpage
221
Lastpage
223
Abstract
This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum. This spans the test vector space to the maximum extent possible for a given number of vectors. This strategy results in a higher fault coverage when the number of vectors that are applied is limited. Results on several ISCAS benchmarks show this strategy to be very effective when a high fault coverage needs to be achieved with a limited number of test vectors. The superiority of the antirandom testing approach is even more significant for testing bridging faults
Keywords
logic testing; ISCAS benchmarks; antirandom testing; bridging faults; pseudorandom testing; test vector space; Circuit faults; Circuit testing; Equations; Fault detection; Hamming distance; High definition video; Monitoring; Read only memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
Conference_Location
Austin, TX
ISSN
1063-6404
Print_ISBN
0-8186-9099-2
Type
conf
DOI
10.1109/ICCD.1998.727054
Filename
727054
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