DocumentCode
2297216
Title
A High-Performance Fault Diagnosis Approach for the AES SubBytes Utilizing Mixed Bases
Author
Mozaffari-Kermani, Mehran ; Reyhani-Masoleh, Arash
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, ON, Canada
fYear
2011
fDate
28-28 Sept. 2011
Firstpage
80
Lastpage
87
Abstract
The Sub Bytes (S-boxes) is the only non-linear transformation in the encryption of the Advanced Encryption Standard (AES), occupying more than half of its hardware implementation resources. One important required aspect of the hardware architectures of the S-boxes is the reliability of their implementations. This can be compromised by occurrence of internal faults or intrusion of the attackers. In this paper, we present a high-speed architecture for the S-boxes constructed using mixed bases to counteract these internal/malicious faults. Although using polynomial and normal bases for the S-boxes has been studied extensively, using mixed bases has just been considered very recently in CHES 2010. In the proposed fault detection scheme of this paper, we present formulations for multi-bit parities for the S-boxes using mixed bases. Then, these formulations are utilized in our error simulations and it is shown that the presented architecture reaches very high error coverage. Through our ASIC syntheses utilizing a 65-nm CMOS technology, we show that with comparable hardware complexity, the efficiency of the presented reliable architecture (without sub-pipelining) reaches around 5.02 Mbps/μm2, outperforming other fault detection schemes for composite field architectures.
Keywords
CMOS integrated circuits; application specific integrated circuits; cryptography; fault diagnosis; polynomials; AES subbytes; ASIC synthesis; CHES 2010; CMOS technology; S-boxes; advanced encryption standard; fault detection scheme; hardware architectures; hardware complexity; high-performance fault diagnosis approach; high-speed architecture; malicious faults; mixed bases; nonlinear transformation; polynomial bases; size 65 nm; Complexity theory; Computer architecture; Delay; Fault detection; Hardware; Polynomials; Reliability; Fault detection; S-box; mixed bases; multi-bit parity;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault Diagnosis and Tolerance in Cryptography (FDTC), 2011 Workshop on
Conference_Location
Nara
Print_ISBN
978-1-4577-1463-4
Type
conf
DOI
10.1109/FDTC.2011.11
Filename
6076470
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