Title :
Tunneling peculiarities in asymmetrical quantum-well structures
Author :
Shulika, A.V. ; Lysak, V.V. ; Sukhoivanov, I.A.
Author_Institution :
Kharkov Nat. Univ. of Radio Electron., Ukraine
Abstract :
Asymmetrical quantum-well structures (AMQW) are layered semiconductor heterostructures having quantum wells of various depth, width, and shape. There are dimensional, compositional, and compound AMQW depending on the cause, which defines potential profile. In SOA with multiple quantum-wells and AMQW as well as in quantum-well lasers carrier transport effects become important and govern nonuniform carrier distribution along the active area. As a rule tunneling transfer is neglected under simulation of multiple quantum-well dynamics. However, tunneling can make significant concurrence for other transport processes under room temperature and thin barriers. The tunneling is the transfer of charge carriers between wells without variation of their energy. Since the structure under consideration is multilayered quantum wells this kind of carrier transfer provides resonant behavior. To take tunneling into account in the frame of rate equations we describe the tunneling rate by means tunneling time. For tunneling time computation we use the group velocity conception in the frame of semiclassical treatment. Our simulations have showed that tunneling time can be comparable to other transport times and even less.
Keywords :
charge exchange; quantum well lasers; resonant tunnelling; semiconductor optical amplifiers; semiconductor quantum wells; SOA; asymmetrical quantum-well structures; carrier transport effects; charge carrier transfer; group velocity conception; layered semiconductor heterostructures; quantum-well lasers; rate equations; tunneling rate; tunneling time computation; tunneling transfer; Charge carriers; Computational modeling; Equations; Quantum well lasers; Quantum wells; Resonance; Semiconductor optical amplifiers; Shape; Temperature; Tunneling;
Conference_Titel :
Laser and Fiber-Optical Networks Modeling, 2003. Proceedings of LFNM 2003. 5th International Workshop on
Print_ISBN :
0-7803-7709-5
DOI :
10.1109/LFNM.2003.1246138