• DocumentCode
    2298184
  • Title

    Texas Instruments´ 4 Mb DRAM-a new, faster generation of DRAM

  • Author

    Rhodine, Craig W.

  • Author_Institution
    Texas Instrum. Inc., Midland, TX, USA
  • fYear
    1991
  • fDate
    20-24 May 1991
  • Firstpage
    317
  • Abstract
    A 4-Mb DRAM (dynamic random access memory) family which improves upon the performance of the 1 Mb DRAM family is described. While increasing storage density and reducing memory access times, overall chip size is minimally affected. Development of 0.9-μm CMOS technology for use on the 4-Mb DRAM allowed immediate speed and size improvements over the 1-Mb DRAM. Continual review of lessons learned on previous design insures that each successive DRAM generation is both more efficient in terms of architecture and more reliable in system use. In the case of the 4-Mb DRAM, this dedication to improvement has resulted tin a 20% speed enhancement, moderate size increase (1.6X), and improved reliability results
  • Keywords
    CMOS integrated circuits; DRAM chips; Texas Instruments computers; integrated circuit technology; memory architecture; 0.9 micron; 4 Mbit; CMOS technology; DRAM; IC technology; Texas Instruments; chip size; dynamic random access memory; military equipment; reliability; size; speed; storage density; Circuits; Delay effects; Instruments; Packaging; Random access memory; Sockets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-0085-8
  • Type

    conf

  • DOI
    10.1109/NAECON.1991.165766
  • Filename
    165766