Title : 
Study of Mixed-signal crosstalk in 3-D package
         
        
            Author : 
Liu, Shuhua ; Cao, Liqiang ; Li, Jun ; Zhou, Yunyan ; Zhou, Jing ; Wang, Qidong ; Dai, Fengwei ; Wan, Lixi ; Guidotti, Daniel
         
        
            Author_Institution : 
Inst. of Microelectron., Chinese Acad. of Sci., Beijing, China
         
        
        
        
        
        
            Abstract : 
With the development of miniaturization, multi-function, environmental protection and other aspects of electronic products, high-density integration technology such as System-on-Chip (SOC) and System-in-Package (SIP) technology has developed rapidly. Mixed-signal integrity in multi-chip integration packages is a main issue. To meet the demand for high-density, 3-D chip stacking is one solution to reduce size and increase the integration. In this paper, three methods are implemented and contrasted: (1) sweep the stack sequence of RF chip and digital chip; (2) investigate the crosstalk with or without adding shielding layer to the stacked dies; (3) investigate the crosstalk with varying the density of ground points on the shielding.
         
        
            Keywords : 
integrated circuit noise; mixed analogue-digital integrated circuits; shielding; system-on-package; three-dimensional integrated circuits; 3D chip stacking; 3D package; RF chip; digital chip; environmental protection; mixed signal crosstalk; mixed signal integrity; multichip integration package; shielding layer; stack sequence; system-in-package; system-on-chip; Analytical models; Crosstalk; Electronics packaging; Packaging; Patents; Radio frequency; Wire;
         
        
        
        
            Conference_Titel : 
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
         
        
            Conference_Location : 
Xi´an
         
        
            Print_ISBN : 
978-1-4244-8140-8
         
        
        
            DOI : 
10.1109/ICEPT.2010.5583791