Title : 
Fault detection and automated fault diagnosis for embedded integrated electrical passives
         
        
            Author : 
Yoon, Heebyung ; Hou, Junwei ; Chatterjee, Abhijit ; Swaminathan, Madhavan
         
        
            Author_Institution : 
Georgia Inst. of Technol., Atlanta, GA, USA
         
        
        
        
        
        
            Abstract : 
In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passive. For pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. The poles and zeros of every circuit in this ensemble are extracted. From knowledge of the passive circuit specifications, pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements
         
        
            Keywords : 
circuit CAD; fault diagnosis; frequency-domain analysis; multichip modules; passive networks; poles and zeros; automated fault diagnosis; embedded integrated electrical passives; fault detection; frequency domain 2-port measurements; parametric faults; passive circuit specifications; pole/zero analysis; region-matching algorithm; statistical distributions; Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Passive circuits; Performance evaluation; Poles and zeros; Statistical distributions;
         
        
        
        
            Conference_Titel : 
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
         
        
            Conference_Location : 
Austin, TX
         
        
        
            Print_ISBN : 
0-8186-9099-2
         
        
        
            DOI : 
10.1109/ICCD.1998.727116