DocumentCode :
2298283
Title :
Fault detection and automated fault diagnosis for embedded integrated electrical passives
Author :
Yoon, Heebyung ; Hou, Junwei ; Chatterjee, Abhijit ; Swaminathan, Madhavan
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1998
fDate :
5-7 Oct 1998
Firstpage :
588
Lastpage :
593
Abstract :
In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passive. For pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. The poles and zeros of every circuit in this ensemble are extracted. From knowledge of the passive circuit specifications, pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements
Keywords :
circuit CAD; fault diagnosis; frequency-domain analysis; multichip modules; passive networks; poles and zeros; automated fault diagnosis; embedded integrated electrical passives; fault detection; frequency domain 2-port measurements; parametric faults; passive circuit specifications; pole/zero analysis; region-matching algorithm; statistical distributions; Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Passive circuits; Performance evaluation; Poles and zeros; Statistical distributions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-8186-9099-2
Type :
conf
DOI :
10.1109/ICCD.1998.727116
Filename :
727116
Link To Document :
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