Title : 
A Memory and Disk Integrity Protection Scheme
         
        
            Author : 
Ma Haifeng ; Yao Nianmin ; Han Yong ; Zhao Jing ; Gao Zhenguo
         
        
            Author_Institution : 
Comput. Sci. & Technol. Inst., Harbin Eng. Univ., Harbin, China
         
        
        
        
        
        
            Abstract : 
Recently, data integrity in computer major becomes concern. The attackers are capable of using various methods to intrude computer network system. The phenomena of confidential information being tampered with or disclosed are emerging everywhere. Hardware-based attacks have emerged and have caused tremendous losses even threaten national security. Existing most of integrity verification designs have the characters of high operation overhead and only protect main memory. This paper presented an integrity protection scheme which can protect main memory and hard disk simultaneously. The scheme maintains an array on trusted on-chip storage to verify the data integrity. It can implement verification through each memory operations. Evaluation results showed that our scheme can protect data integrity of single processor with low overhead and high performance.
         
        
            Keywords : 
data integrity; data privacy; formal verification; hard discs; security of data; storage management; computer network system intrusion; confidential information tampering; data integrity verification; disk integrity protection scheme; hard disk protection; hardware-based attacks; integrity verification designs; main memory protection; national security; trusted on-chip storage; Arrays; Computers; Hardware; Radiation detectors; Security; System-on-a-chip; Bloom filter; Hash tree; Integrity verification; Parallel computing;
         
        
        
        
            Conference_Titel : 
Internet Computing for Science and Engineering (ICICSE), 2010 Fifth International Conference on
         
        
            Conference_Location : 
Heilongjiang
         
        
            Print_ISBN : 
978-1-4244-9954-0
         
        
        
            DOI : 
10.1109/ICICSE.2010.40