Title : 
Finite bisimulation of reactive untimed infinite state systems modeled as automata with variables
         
        
            Author : 
Kumar, Ratnesh ; Zhou, Changyan ; Basu, Samik
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA
         
        
        
        
            Abstract : 
Some discrete event systems such as software are typically infinite state systems, and a commonly used technique for performing formal analysis such as automated verification is based on their finite abstractions. In this paper, we consider a model for reactive untimed infinite state systems called input-output extended finite automaton (I/O-EFA), which is an automaton extended with discrete variables such as inputs, outputs, and data. Using I/O-EFA as a model many value-passing processes can be represented by finite graphs. We study the problem of finding a finite abstraction that is bisimilar to a given I/O-EFA. We present a sufficient condition under which the underlying transition system of an I/O-EFA admits a finite bisimilar quotient. This sufficient condition is existential as it relies on the existence of a suitable partition of the state space. We then identify a class of I/O-EFAs for which a partition satisfying our sufficient condition can be constructed by inspecting the structure of the given I/O-EFA
         
        
            Keywords : 
discrete event systems; finite automata; graph theory; bisimulation equivalence; discrete event systems; extended automata; finite abstraction; finite bisimilar quotient; finite bisimulation; finite graphs; formal analysis; formal verification; input-output extended finite automaton; reactive untimed infinite state systems; software abstraction; software modeling; software verification; state space partitioning; symbolic transition systems; Automata; Automatic control; Computer science; Discrete event systems; Formal verification; Performance analysis; Software performance; Software systems; State-space methods; Sufficient conditions;
         
        
        
        
            Conference_Titel : 
American Control Conference, 2006
         
        
            Conference_Location : 
Minneapolis, MN
         
        
            Print_ISBN : 
1-4244-0209-3
         
        
            Electronic_ISBN : 
1-4244-0209-3
         
        
        
            DOI : 
10.1109/ACC.2006.1657692