• DocumentCode
    2299216
  • Title

    High current 3D symmetrical inductor integrated in an advanced HR SOI CMOS technology targeting RF power applications

  • Author

    Gianesello, F. ; Gloria, D. ; Bon, O. ; Rauber, B. ; Raynaud, C.

  • Author_Institution
    TR&D, TPS Lab., STMicroelectronics, Crolles, France
  • fYear
    2009
  • fDate
    7-9 June 2009
  • Firstpage
    517
  • Lastpage
    520
  • Abstract
    During past years, high resistivity (HR) SOI CMOS technology has emerged as a promising one for the integration of RF applications, mainly because of the improvement of passive component related to HR substrate. In this trend, 3D symmetrical inductor (3DSI) has been proposed on SOI to lower the amount of area consumed by inductor while offering comparable performances than equivalent bulk technology. Recently 3DSI performances have been improved using generalized Group Cross layout (3DGCSI) technique. Unfortunately in advanced CMOS technology 3D inductor architecture suffer from limited current capability since they use the lower levels of the BEOL (which are thinner). This paper presents a novel class of High Current 3DSI (HC3DSI) aiming to resolve this issue by offering at the same time a compact form factor and high current capability. Measurement data of 3DGCSI and HC3DSI are compared with each other to investigate the advantages of this new inductor structure.
  • Keywords
    CMOS integrated circuits; radiofrequency integrated circuits; silicon-on-insulator; RF power applications; advanced high resistivity SOI CMOS technology; generalized group cross layout technique; high current 3D symmetrical inductor; CMOS digital integrated circuits; CMOS technology; Cellular phones; Conductivity; Isolation technology; Q factor; Radio frequency; Silicon on insulator technology; Switches; Thin film inductors; High Resistivity; Integrated Inductor; Quality factor; SOI; Self resonance frequency; Symmetrical inductor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium, 2009. RFIC 2009. IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-3377-3
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2009.5135593
  • Filename
    5135593