• DocumentCode
    2299586
  • Title

    A new development in embedded computer performance measurement

  • Author

    Kohalmi, Diane ; Newport, John ; Paul, Diane ; Roark, Chuck ; Struble, David G.

  • Author_Institution
    US Naval Avionics Center, Indianapolis, IN, USA
  • fYear
    1991
  • fDate
    20-24 May 1991
  • Firstpage
    633
  • Abstract
    The authors report on the results of Phase I of the Advanced Avionics Technology Demonstration (AATD) Embedded Computer Performance Measurement (ECPM) program performanced by Texas Instruments (TI) for the Naval Avionics Center (NAC). During Phase I of the AATD program, novel techniques were developed to measure spare processing throughput and I/O for use in comparing different embedded computer systems and to measure spare processing throughput and spare I/O percentages in support of US government standards such as TADSTAND D, which defines Navy policy requirements for computer reserves. TI used its MIL-STD-1750A based Mission Display Processor (MDP), developed for the YF-22 ATF DEM/VAL program, as the initial target computing system for this effort. The cornerstone of the benchmark is a NAC Developed navigation program which was hosted on a VAX and retargeted by TI to its MDP
  • Keywords
    aerospace computing; aerospace simulation; computer testing; military computing; performance evaluation; standards; Ada; Advanced Avionics Technology Demonstration; I/O; MIL-STD-1750A; Mission Display Processor; Naval Avionics Center; Navy; TADSTAND D; TI; Texas Instruments; US government standards; VAX; YF-22 ATF DEM/VAL program; benchmark; embedded computer performance measurement; navigation; spare processing throughput; Aerospace electronics; Computer displays; Computer performance; Embedded computing; Instruments; Military computing; Performance evaluation; Phase measurement; Throughput; US Government;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-0085-8
  • Type

    conf

  • DOI
    10.1109/NAECON.1991.165817
  • Filename
    165817