• DocumentCode
    2299630
  • Title

    Measurement of organic and inorganic ions in cable insulation and shields

  • Author

    Gilbert, R. ; Crine, J.-P. ; Noirhomme, B. ; Pélissou, S.

  • Author_Institution
    Hydro-Quebec, Varennes, Que., Canada
  • fYear
    1989
  • fDate
    29 Oct-2 Nov 1989
  • Firstpage
    235
  • Lastpage
    240
  • Abstract
    It was demonstrated that HPIC (high-performance ion chromatography) can detect inorganic and organic ions in PE (polyethylene) and XLPE (cross-linked PE) insulation and shields in concentrations as low as ~10 μg/L in the extraction solutions. This analytical technique requires liquid extraction of the ions prior to their content evaluation. The limitations of the extraction technique used are discussed. The detected inorganic ions correspond to the elements determined by other analytical techniques, but the ionic fraction is small. The actual ionic fraction could be higher, since the extraction technique used is far from being optimized. Manufacturing and aging lead to increased SO2-4 and Cl- contamination in XLPE cables. Migration from the contaminated shields appears to be one of the causes for this increase. Use of the much cleaner acetylene black should improve the situation. Organic ions were also detected and appear to be essentially by-products of PE oxidation. It is possible that service aging induces the formation of more oxalate ions. Shields made with ethylene vinyl acetate may also generate some acetate ions
  • Keywords
    cable insulation; cable sheathing; chromatography; insulation testing; organic insulating materials; polymers; PE oxidation; XLPE; acetylene black; ageing; analytical technique; cable insulation; cross-linked PE; ethylene vinyl acetate; extraction technique; high-performance ion chromatography; inorganic ions; polyethylene; shields; Aging; Cable insulation; Cable shielding; Cables; Curing; Impurities; Pollution measurement; Polyethylene; Polymers; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on
  • Conference_Location
    Leesburg, VA
  • Type

    conf

  • DOI
    10.1109/CEIDP.1989.69552
  • Filename
    69552