• DocumentCode
    2300029
  • Title

    A Fuzzy Algorithm to Trace Stained Neurons in Serial Block-Face Scanning Electron Microscopy Image Series

  • Author

    Saetzler, K. ; McCanny, P. ; Rodriguez, E.P. ; Horstmann, H. ; Bruno, R.M. ; Denk, W.

  • Author_Institution
    Syst. Biol. Res. Group, Univ. of Ulster, Coleraine, UK
  • fYear
    2009
  • fDate
    2-4 Sept. 2009
  • Firstpage
    162
  • Lastpage
    167
  • Abstract
    With the recently developed serial block-face scanning electron microscope (SBFSEM) it is now possible to analyze the 3-D structure of biological specimens at a resolution that is one order of magnitude better compared to light microscopy requiring minimal user input. It allows the automatic creation of large series (> 1000) of digitally imaged ultra-thin sections (< 100 nm) from heavy metal-stained and plastic embedded tissue. Together with the ability of selectively staining individual, identified neurons using electron dense material one can visually track the complete structure at a resolution as low as 20 times 20 times 40 nm. Here we introduce a simple fuzzy region-growing tracing algorithm that incorporates a minimum of prior knowledge about object and background gray level distributions. We show that this algorithm reliably traces structures of interest over several hundreds of sections opening the unique opportunity to systematically study the morphology of neuronal structures at the nanometre scale in a fully automated way.
  • Keywords
    biological techniques; biology computing; cellular biophysics; fuzzy logic; image processing; image reconstruction; neurophysiology; scanning electron microscopy; 3D reconstruction; 3D structure; background gray level distribution; biological imaging; electron dense material; fuzzy algorithm; neuronal structure morphology; region-growing tracing algorithm; serial block-face scanning electron microscopy; trace stained neurons; Data mining; Image processing; Image reconstruction; Machine vision; Nanobioscience; Nerve fibers; Neurons; Optical microscopy; Scanning electron microscopy; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Vision and Image Processing Conference, 2009. IMVIP '09. 13th International
  • Conference_Location
    Dublin
  • Print_ISBN
    978-1-4244-4875-3
  • Electronic_ISBN
    978-0-7695-3796-2
  • Type

    conf

  • DOI
    10.1109/IMVIP.2009.36
  • Filename
    5319293