• DocumentCode
    2300152
  • Title

    Bit Error Probability of Narrow-Band Digital FM with Limiter-Discriminator-Integrator Detection in Hoyt Mobile Radio Fading Channels

  • Author

    Hajri, Nazih ; Youssef, Neji

  • Author_Institution
    Ecole Super. des Commun. de Tunis, Tunis
  • fYear
    2007
  • fDate
    3-7 Sept. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Performance analysis of narrow-band digital frequency shift keying (FSK) modulation with limiter-discriminator-integrator (LDI) detection over Hoyt mobile fading channels is presented. Closed form expressions are derived for the probability density function (PDF) of the phase angle between two Hoyt fading vectors, for the phase noise due to additive Gaussian noise, as well as for the average number of FM clicks occurring at the output of a digital FM receiver. Then, based on these investigated quantities, a formula for the bit error probability (BER) of FSK transmission over Hoyt channels is deduced. Since the Rayleigh fading model is a special case of the Hoyt model, the derived quantities are verified to reduce to known results corresponding to Rayleigh fading. A numerical example is given to illustrate the analysis and study the influence of the fading severity as well as the FM system parameters on the error performance.
  • Keywords
    Rayleigh channels; error statistics; frequency shift keying; mobile radio; phase noise; BER; Hoyt mobile radio fading channels; Rayleigh fading model; additive Gaussian noise; bit error probability; limiter-discriminator-integrator detection; narrow-band digital FM; narrow-band digital frequency shift keying modulation; phase noise; probability density function; Digital modulation; Error probability; Fading; Frequency modulation; Frequency shift keying; Land mobile radio; Narrowband; Performance analysis; Probability density function; Rayleigh channels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Personal, Indoor and Mobile Radio Communications, 2007. PIMRC 2007. IEEE 18th International Symposium on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-1144-3
  • Electronic_ISBN
    978-1-4244-1144-3
  • Type

    conf

  • DOI
    10.1109/PIMRC.2007.4394680
  • Filename
    4394680