DocumentCode :
2300305
Title :
A study on split-output TSPC CMOS circuits
Author :
Antaki, Bernard ; Patenaude, Serge ; Trognon, Laure ; Savaria, Yvon
Author_Institution :
Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
Volume :
3
fYear :
1997
fDate :
9-12 Jun 1997
Firstpage :
1892
Abstract :
In this paper, we present a heuristic study of a class of CMOS true single-phase clocked circuits (TSPC). TSPC circuits have proven to yield good performances at high frequencies. The proposed method may speed up design by identifying technology insensitive circuit properties. Our study focuses on split-output circuits which are believed to yield better performances than the other single-phase clocked circuits. We also present a characterization of the performances of these circuits as a function of load with NORTEL 0.8 μm CMOS technology. With realistic (nonideal) Hspice simulated netlist extracted from layout, we observed that the maximum operating frequency for split-output was 1.17 GHz. It is shown that the maximum speed of TSPC latches obtained with our simple suboptimal design method does not directly decrease with loading as in static gates. Finally, the speed degradation of the studied circuit with degraded clocks is characterized
Keywords :
CMOS logic circuits; integrated circuit design; logic design; timing; 0.8 micron; 1.17 GHz; Hspice simulated netlist extraction; NORTEL CMOS technology; TSPC CMOS circuits; TSPC latches; degraded clocks; performance characterization; speed degradation; split-output circuits; suboptimal design method; technology insensitive circuit properties; true single-phase clocked circuits; CMOS technology; Circuit simulation; Circuit stability; Circuit testing; Clocks; Degradation; Frequency; Latches; Libraries; Proposals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on
Print_ISBN :
0-7803-3583-X
Type :
conf
DOI :
10.1109/ISCAS.1997.621519
Filename :
621519
Link To Document :
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