DocumentCode
2300593
Title
Defect-free manufacturing in the nineties
Author
Raheja, Dev G. ; Lindsley, Michelle L.
Author_Institution
Technol. Manage. Inc., Laurel, MD, USA
fYear
1991
fDate
20-24 May 1991
Firstpage
1019
Abstract
Some techniques for defect-free manufacturing for the 1990s are presented, along with case histories. Particular attention is given to such techniques as process failure modes and effects analysis, fault-tree analysis, and process analysis mappings
Keywords
electronic equipment manufacture; failure analysis; quality control; reliability; 1990s; QC; aerospace components; defect-free manufacturing; effects analysis; fault-tree analysis; process analysis mappings; process failure; reliability; Availability; Control systems; Failure analysis; History; Manufacturing industries; Manufacturing processes; Process control; Process design; Product design; Quality function deployment;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
Conference_Location
Dayton, OH
Print_ISBN
0-7803-0085-8
Type
conf
DOI
10.1109/NAECON.1991.165882
Filename
165882
Link To Document