Title :
Spectral-polarization imaging with CMOS-metallic nanowires sensor
Author :
Gruev, Viktor ; Kulkarni, Meenal
Author_Institution :
Dept. of Comput. Sci. & Eng., Washington Univ. in St. Louis, St. Louis, MO, USA
Abstract :
We have presented an integrated Division-of-Focal-Plane spectral-polarization sensor in this paper. The sensor monolithically integrates pixelated aluminum nanowire polarization filters with an array of vertically stacked photo detectors. Each individual pixel in the imaging array is composed of three vertically stacked photo detectors together with the necessary read-out electronics, such as source follower, reset transistor and address transistor. The pixelated polarization filter array is composed of four distinct linear polarization filters oriented at 45 degrees from each other. The complete sensor is capable of sensing both spectral and polarization information across the visible spectrum at 4 frames per second. A summary of the imaging sensor characteristics is provided in Table 1.
Keywords :
CMOS image sensors; aluminium; focal planes; light polarisation; nanowires; optical filters; optical sensors; photodetectors; readout electronics; Al; CMOS-metallic nanowires sensor; address transistor; aluminum nanowire polarization filters; imaging array; integrated division-of-focal-plane; polarization information; read-out electronics; reset transistor; source follower; spectral information; spectral-polarization imaging; spectral-polarization sensor; vertically stacked photodetectors; visible spectrum; Arrays; Image quality; Imaging; Maximum likelihood detection; Nanowires; Optical filters; Photodetectors;
Conference_Titel :
Photonics Conference (IPC), 2012 IEEE
Conference_Location :
Burlingame, CA
Print_ISBN :
978-1-4577-0731-5
DOI :
10.1109/IPCon.2012.6358576