Title :
Evaluation of Light-Triggered Thyristors for Pulsed Power Applications
Author :
Tully, L.K. ; Fulkerson, E.S. ; Goerz, D.A. ; Speer, R.D.
Author_Institution :
Lawrence Livermore Nat. Lab., Livermore, CA
Abstract :
Lawrence Livermore National Laboratory has many needs for high reliability, high peak current, high di/dt switches. Solid-state switch technology offers the demonstrated advantage of reliability under a variety of conditions. Light-triggered switches operate with a reduced susceptibility to electromagnetic interference commonly found within pulsed power environments. Despite the advantages, commercially available solid-state switches are not typically designed for the often extreme pulsed power requirements. Testing was performed to bound the limits of devices for pulsed power applications beyond the manufacturers´ specified ratings. To test the applicability of recent commercial light-triggered solid-state designs, an adjustable high current switch test stand was assembled. Results from testing and subsequent selected implementations are presented.
Keywords :
electromagnetic interference; pulsed power switches; reliability; thyristor applications; Lawrence Livermore National Laboratory; electromagnetic interference; high current switch test stand; light-triggered thyristors; pulsed power applications; solid-state switch technology; switching reliability; Assembly; EMP radiation effects; Electromagnetic interference; Laboratories; Manufacturing; Performance evaluation; Solid state circuits; Switches; Testing; Thyristors;
Conference_Titel :
IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
Conference_Location :
Las Vegas, NE
Print_ISBN :
978-1-4244-1534-2
Electronic_ISBN :
978-1-4244-1535-9
DOI :
10.1109/IPMC.2008.4743561