• DocumentCode
    2301040
  • Title

    Fretting corrosion degradation, threshold behavior and contact instability [electrical contacts]

  • Author

    Malucci, Robert D.

  • Author_Institution
    RD Malucci Consulting, Naperville, IL, USA
  • fYear
    2003
  • fDate
    8-10 Sept. 2003
  • Firstpage
    2
  • Lastpage
    15
  • Abstract
    This paper addresses the electrical behavior of tin plated contacts as fretting corrosion progresses. An empirical model was developed on the basis of accelerated laboratory tests that utilize thermal cycling and vibration as major stress factors. During the course of these studies, a number of characteristics such as oxide film build up and electrical stability were revealed as fretting progressed. Moreover, threshold behavior for the onset of fretting corrosion was observed with respect to fretting amplitude. In addition, a theoretical basis for oxide build up is provided to understand the various results published over the last three decades. It is concluded that consideration of models that include, oxidation rate, stress relaxation, fretting amplitude and fretting cycles are useful in designing accelerated fretting tests. Moreover, it was found that knowledge of amplitude thresholds is needed to relate test parameters to field stresses. It was also shown, from the chaotic behavior of degraded contacts, that stability thresholds occur which help define contact resistance failure criteria. Consequently, the results of these efforts reveal an understanding of the nature of the fretting corrosion degradation mechanism and provide guidelines in developing accelerated tests and performance criteria.
  • Keywords
    chaos; contact resistance; corrosion; dynamic testing; electrical contacts; failure analysis; life testing; oxidation; stress relaxation; thermal stresses; tin; wear; Sn; accelerated tests; contact instability; contact resistance failure; degraded contact chaotic behavior; fretting amplitude; fretting corrosion degradation; fretting cycles; fretting threshold behavior; oxidation rate; oxide film build up; stress relaxation; thermal cycling; tin plated contact electrical behavior; vibration stress; Contacts; Corrosion; Laboratories; Life estimation; Stability; Testing; Thermal degradation; Thermal factors; Thermal stresses; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2003. Proceedings of the Forty-Ninth IEEE Holm Conference on
  • Print_ISBN
    0-7803-7862-8
  • Type

    conf

  • DOI
    10.1109/HOLM.2003.1246472
  • Filename
    1246472